Alain C. Diebold books & textbook
Handbook of Silicon Semiconductor Metrology
CRC Press /2001-06-29 Hardcover / 894 Pages
isbn-10: 0824705068 / isbn-13: 9780824705060
Characterization and Metrology for ULSI Technology 2000: International Conference (AIP Conference Proceedings, 550)
Alain C. Diebold D. G. Seiler David G. Seiler
American Institute of Physics /2001-03-01 Hardcover / 723 Pages
isbn-10: 156396967X / isbn-13: 9781563969676
Characterization and Metrology for Ulsi Technology : 1998 International Conference (AIP Conference Proceedings, Vol. 449 With CD ROM)
David G. Seiler,Alain C. Diebold,W. Murray Bullis
American Inst. of Physics /1998-12-14 Hardcover / 960 Pages
isbn-10: 1563967537 / isbn-13: 9781563967535
Frontiers of Characterization and Metrology for Nanoelectronics: 2009 (AIP Conference Proceedings, 1173)
David G. Seiler Rajinder P. Khosla Dan Herr Robert McDonald Alain C. Diebold C. Michael Garner
American Institute of Physics /2009-10-26 Hardcover / 320 Pages
isbn-10: 0735407126 / isbn-13: 9780735407121
Frontiers of Characterization and Metrology for Nanoelectronics: 2007 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (AIP Conference Proceedings, 931)
David G. Seiler Alain C. Diebold Robert McDonald
American Institute of Physics /2007-01-01 Hardcover / 592 Pages
isbn-10: 0735404410 / isbn-13: 9780735404410
Characterization and Metrology for ULSI Technology 2005 (AIP Conference Proceedings, 788)
David G. Seiler,Alain C. Diebold,D. G. Seiler
American Inst. of Physics /2005-09-01 Hardcover
isbn-10: 0735402779 / isbn-13: 9780735402775
Characterization and Metrology for ULSI Technology: 2003: 2003 International Conference on Characterization and Metrology for ULSI Technology (AIP Conference Proceedings, 683)
Alain C. Diebold Thomas J. Shaffner David G. Seiler
American Institute of Physics /2003-01-01 Hardcover / 818 Pages
isbn-10: 0735401527 / isbn-13: 9780735401525
