ISBN 9780735407121 books & textbook
Frontiers of Characterization and Metrology for Nanoelectronics: 2009 (AIP Conference Proceedings, 1173)
David G. Seiler Rajinder P. Khosla Dan Herr Robert McDonald Alain C. Diebold C. Michael Garner
American Institute of Physics /2009-10-26 Hardcover / 320 Pages
isbn-10: 0735407126 / isbn-13: 9780735407121
