ISBN 1563967537 books & textbook
Characterization and Metrology for Ulsi Technology : 1998 International Conference (AIP Conference Proceedings, Vol. 449 With CD ROM)
David G. Seiler,Alain C. Diebold,W. Murray Bullis
American Inst. of Physics /1998-12-14 Hardcover / 960 Pages
isbn-10: 1563967537 / isbn-13: 9781563967535
