ISBN 0735404410 books & textbook
Frontiers of Characterization and Metrology for Nanoelectronics: 2007 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (AIP Conference Proceedings, 931)
David G. Seiler Alain C. Diebold Robert McDonald
American Institute of Physics /2007-01-01 Hardcover / 592 Pages
isbn-10: 0735404410 / isbn-13: 9780735404410
