Yu, Ben T. books & textbook
VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover))
Wang, Laung-Terng Wu, Cheng-Wen Wen, Xiaoqing Abdel-Hafez, Khader S. Jone, Wen-Ben Kapur, Rohit Keller, Brion Lee, Kuen-Jong Li, James C.-M. Li, Mike Peng Li, Xiaowei Mak, T.M. Min, Yinghua Nadeau-Dostie, Benoit Bhattacharya, Soumendu Nourani, Mehrdad Rajski, Janusz Stroud, Charles Volkerink, Erik H. Walker, Duncan M. (Hank) Wu, Shianling Touba, Nur A. Chatterjee, Abhijit Chen, Xinghao Cheng, Kwang-Ting (Tim) Eklow, William Hsiao, Michael S. Huang, Jiun-Lang Huang, Shi-Yu
Morgan Kaufmann /2006-07-21 Hardcover / 808 Pages
isbn-10: 0123705975 / isbn-13: 9780123705976
The Power of Supply and Demand: Thinking Tools and Case Studies for Students and Professionals
Lai, Wai Chung Lawrence Yu, Ben T.
Hong Kong University Press /2002-12-01 Paperback / 352 Pages
isbn-10: 9622095690 / isbn-13: 9789622095694
Institutional Development of the Insurance Industry
City University of Hong Kong Press /1997-05-01 Paperback / 177 Pages
isbn-10: 9629370077 / isbn-13: 9789629370077
