Stroud, Charles books & textbook
VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover))
Wang, Laung-Terng Wu, Cheng-Wen Wen, Xiaoqing Abdel-Hafez, Khader S. Jone, Wen-Ben Kapur, Rohit Keller, Brion Lee, Kuen-Jong Li, James C.-M. Li, Mike Peng Li, Xiaowei Mak, T.M. Min, Yinghua Nadeau-Dostie, Benoit Bhattacharya, Soumendu Nourani, Mehrdad Rajski, Janusz Stroud, Charles Volkerink, Erik H. Walker, Duncan M. (Hank) Wu, Shianling Touba, Nur A. Chatterjee, Abhijit Chen, Xinghao Cheng, Kwang-Ting (Tim) Eklow, William Hsiao, Michael S. Huang, Jiun-Lang Huang, Shi-Yu
Morgan Kaufmann /2006-07-21 Hardcover / 808 Pages
isbn-10: 0123705975 / isbn-13: 9780123705976
The Empiricists: Critical Essays on Locke, Berkeley, and Hume (Critical Essays on the Classics Series)
Atherton, Margaret Ayers, M R. Cummins, Phillip D. Fogelin, Robert Garrett, Don McCann, Edwin McCracken, Charles J. Pappas, George Rogers, G.A.J Stroud, Barry Tipton, Ian Wilson, Margaret D. Winkler, Kenneth
Rowman & Littlefield Publishers /1998-12-23 Paperback / 278 Pages
isbn-10: 0847689131 / isbn-13: 9780847689132
The Logical Alien: Conant and His Critics
Miguens, Sofia Conant, James Benoist, Jocelyn Boyle, Matthew Gustafsson, Martin Hamawaki, Arata Moore, Adrian Stroud, Prof. Barry Sullivan, Peter Travis, Charles
Harvard University Press /2020-02-11 Hardcover / 1080 Pages
isbn-10: 0674335902 / isbn-13: 9780674335905
The Southern Poetry Anthology, Volume VII: North Carolina (Volume 7)
Wright, William Graves, Jesse Ruffin, Paul Absher, J.S. Adams, Martha O. Adcock, Betty Applewhite, James Arnold, Martin Arnoult, Darnell Baggett, Pam Baggett, Rebecca Barbee, Sam Barr, Tina Bassett, Win Barthanti, Joseph Beadle, Michael Beall, Glenda Council Benjamin, Nancy Walker Boccardo, Michael Bonner, Hannah Bowers, Cathy Smith Bresnahan, Peg Byer, Kathryn Stripling Campbell, Barbara Carter, Catherine Carry, Jessie Chappell, Fred Cherry, Kelly Childress, Catherine Pritchard Chitwood, Michael Clark, Jim Cody, Michael Cohen, Claudette Collins, Wiki Conrad, Barbara Copeland, Beth Crews, Mary Crowe, Thomas Rain Crutchfield, John Cushman, Steve Doyle, Caitlyn Erickson, Terri Kirby Flowers, William Flynn, Keith Gerard, Jill Gibson, Becky Gould Hankins, Luke Harmon, William Hennessy, Mary Honeycutt, Irene Blair Hooper, Patricia Hoppenthaler, John Hubbard, Jenny Huener, Sarah Jackson, Elizabeth W. Jacobstein, Roy Johnson, Alice Owens Johnson, Larry Joyner, Janet Kaufman, Debra Kennedy, Terry L. Lader, Bruce Losse, Helen MacKethan, Lucinda Maginnes, Al Makuck, Peter Mannone, John C. Martin, Brent McClure, J.G. McFee, Michael McLarney, Rose Meads, Kat Merritt, Rob Meyers, Susan Laughter Miles, Jeff Mitchell, Maren O. Mohney, Sally Stewart Moore, Carolyn Moore, Janice Townley Moore, Lenard D. Morgan, Robert Morris, Tony Nafekh, Tracey J. Nieman, Valerie Ocasio, Grace C. O'Connor, Kimberly Olson, Ted Osborn, Alice Owens, Scott Pait, Randy W. Park, Thomas Peck, Gail Phillips, Anna Lena Pinckeny, Diana Poston, David E. Potts, Michael Powell, Dannye Romine Powell, Tara Presnell, Barbara Radavich, David Rash, Ron Rice, Jonathan K. Roberts, Kim Roberts, Megan Robinson, Lucia Walton Russo, Dave Sasser, Jane Shlensky, Jane Shockley, Evie Siddall, Sherry Smith, Douglas Smith, Emily Louise Soniat, Katherine Stephenson, Shelby Stroud, Christine H. Suk, Julie Sweeney, Sarah Taylor, Jo Barbara Taylor, Richard Allen Waldrep, G.C. Ward, Shannon Camlin Warren, Rebecca Weaver, Anna West, Robert Whisnant, Luke White, Charles Dodd White, Ross Whitehead, Cheryl Wieland, Liza Wilson, Dede Wimberley, Matthew Woodworth, Anne Harding Wooten, Robert York, John Thomas Zerkle, Liza
Texas Review Press /2015-01-09 Paperback / 232 Pages
isbn-10: 1937875873 / isbn-13: 9781937875879
System-on-Chip Test Architectures: Nanometer Design for Testability (Volume .) (Systems on Silicon, Volume .)
Wang, Laung-Terng Stroud, Charles E. Touba, Nur A.
Morgan Kaufmann /2007-12-04 Hardcover / 896 Pages
isbn-10: 012373973X / isbn-13: 9780123739735
A Designer’s Guide to Built-In Self-Test (Frontiers in Electronic Testing, 19)
Springer /2002-05-31 Hardcover / 340 Pages
isbn-10: 1402070500 / isbn-13: 9781402070501
A Designer's Guide to Built-in Self-Test by Stroud, Charles E. [Springer,2002] (Hardcover) [Hardcover]
Springer,2002 /2002-01-01 Hardcover
Caliope : Contest of Cultural Difference & honor code in Amar Despues de La Muerte by Calderon; Petrarch, Don Juan & Ana Caro; Sexual Landscapes of Celestina; Irony & Picaresque Tradition; Friendship in El Pintor De Su Deshonra by
Anne J. Cruz Dian Fox Matthew D. Stroud Harry Velez-Wuinones Susan L. Fischer Charles Oriel Edward H. Friedman James A Parr
Society for Renaissancde and Baroque Hispanic Poetry /2000T Journal
Commercial Low-Voltage Wiring (MARCRAFT an ETC Brand)
Charles J. Brooks & Ray Stroud
Educational Technologies Group inc / Paperback
isbn-10: 1581220855 / isbn-13: 9781581220858
The Philosophy of Robert Ettinger
Tandy Ph.D., Charles Stroud, Associate Professor of Communication Studies Scott R
Universal Publishers /2002-12-15 Hardcover / 276 Pages
isbn-10: 158112600X / isbn-13: 9781581126006
