Li, Mike Peng books & textbook
VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover))
Wang, Laung-Terng Wu, Cheng-Wen Wen, Xiaoqing Abdel-Hafez, Khader S. Jone, Wen-Ben Kapur, Rohit Keller, Brion Lee, Kuen-Jong Li, James C.-M. Li, Mike Peng Li, Xiaowei Mak, T.M. Min, Yinghua Nadeau-Dostie, Benoit Bhattacharya, Soumendu Nourani, Mehrdad Rajski, Janusz Stroud, Charles Volkerink, Erik H. Walker, Duncan M. (Hank) Wu, Shianling Touba, Nur A. Chatterjee, Abhijit Chen, Xinghao Cheng, Kwang-Ting (Tim) Eklow, William Hsiao, Michael S. Huang, Jiun-Lang Huang, Shi-Yu
Morgan Kaufmann /2006-07-21 Hardcover / 808 Pages
isbn-10: 0123705975 / isbn-13: 9780123705976
Jitter, Noise, and Signal Integrity at High-speed
Prentice Hall /2007-01-01 Hardcover / 368 Pages
isbn-10: 0132429616 / isbn-13: 9780132429610
[(Design and Test for Multiple Gbps Communication Devices and Systems)] [Author: Mike Peng Li] published on (December, 2005)
International Engineering Consortium / Unknown Binding
