Min, Yinghua books & textbook
VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover))
Wang, Laung-Terng Wu, Cheng-Wen Wen, Xiaoqing Abdel-Hafez, Khader S. Jone, Wen-Ben Kapur, Rohit Keller, Brion Lee, Kuen-Jong Li, James C.-M. Li, Mike Peng Li, Xiaowei Mak, T.M. Min, Yinghua Nadeau-Dostie, Benoit Bhattacharya, Soumendu Nourani, Mehrdad Rajski, Janusz Stroud, Charles Volkerink, Erik H. Walker, Duncan M. (Hank) Wu, Shianling Touba, Nur A. Chatterjee, Abhijit Chen, Xinghao Cheng, Kwang-Ting (Tim) Eklow, William Hsiao, Michael S. Huang, Jiun-Lang Huang, Shi-Yu
Morgan Kaufmann /2006-07-21 Hardcover / 808 Pages
isbn-10: 0123705975 / isbn-13: 9780123705976
Border Crossings: North and South Korean Insights from the Sigg Collection
Buhler, Kathleen Zimmer, Nina Kim, Sunhee Kim, Sunjung Koh, Wonseok Lu, Carol Yinghua Muhn, B.G. Park, Kyong Wenger, Stefanie Marlene Yoon, Min-Kyung
Hatje Cantz /2021-07-13 Paperback / 280 Pages
isbn-10: 3775749160 / isbn-13: 9783775749169
Wang Yin
Lu, Carol Yinghua Li, Lucy Yin, Wang Zuo, Jing Wang, Min'an
Blue Kingfisher /2011-08-31 Hardcover / 136 Pages
isbn-10: 9881881633 / isbn-13: 9789881881632
