Seiler, David G. G. books & textbook
Life on Hold: Finding Hope in the Face of Serious Illness
Seiler, David G. G. Brunvoll, Laurel S.
Random House Publishing Group /2006-06-01 Paperback / 288 Pages
isbn-10: 1590528271 / isbn-13: 9781590528273
By David G. Seiler - Life on Hold: Finding Hope in the Face of Serious Illness (2006-06-16) [Paperback]
Multnomah Books / Unknown Binding
Metrology and Diagnostic Techniques for Nanoelectronics
Jenny Stanford Publishing /2016-10-03 Hardcover / 1454 Pages
isbn-10: 9814745081 / isbn-13: 9789814745086
Teaching and Learning Science
Tobin, Kenneth Boone, William J. Donnelly, Lisa A. Treagust, David F. Kozoll, Richard H. Osborne, Margery D. Staver, John R. Roth, Wolff-Michael Fraser, Barry J. Pozzer-Ardenghi, Lilian Hand, Brian Holliday, William G. Wassell Rowan University, Beth Bouillian, Lisa M. DeGennaro, Donna McGonigal, Judith A. Beers, Jennifer McCreedy, Dale Luke, Jessica J. Cochran, Kathryn F. Duncan, Garrett Albert Yerrick, Randy K. Nichols, Sharon Simon, Ruby Elmesky, Rowhea Scantlebury, Kathryn Barton, Angela Calabrese Vora, Purvi Rodriguez, Alberto J. Martin, Sonya N. Gleason, Susan Fennemore, Melissa Tippins, Deborah J. Bhukanwala, Foram LaVan, Sarah-Kate Ritchie, Stephen M. Ritchie, Scott Wandersee, James H. Clary, Renee M. Tobin, Barbara Casey, Shannon Krajcik director of CREATE for STEM Institute and Lappan-Phillips Professor of Sci, Joseph Mamlok-Naaman, Rachel Giombetti, Cassondra Seiler, Gale Elinich, Karen Robotics, First State Inc. Klein, Christine Adams, Jennifer D. Lebak, Kimberly Milne, Catherine Garnett, Pamela J. Otieno, Tracey Robison, David Kluge, Steven Smith, Michael J. Southard, John B. Kirch, SusanA Amoroso, Michele Roussos, Katy Truby, James de Laeter, John Robert Shipman, Harry L. Ruscher, Paul H. Lim, Miyoun Ortiz, Loaiza Contento, Isobel R. Koch, Pamela A. Dadds, Marcia Dubno, Danielle Smith, Marsha Nam, Ji-Myung Homan, Shophie
R&L Education /2008-07-08 Paperback / 580 Pages
isbn-10: 1578866863 / isbn-13: 9781578866861
Characterization and Metrology for ULSI Technology 2000: International Conference (AIP Conference Proceedings, 550)
Alain C. Diebold D. G. Seiler David G. Seiler
American Institute of Physics /2001-03-01 Hardcover / 723 Pages
isbn-10: 156396967X / isbn-13: 9781563969676
Characterization and Metrology for Ulsi Technology : 1998 International Conference (AIP Conference Proceedings, Vol. 449 With CD ROM)
David G. Seiler,Alain C. Diebold,W. Murray Bullis
American Inst. of Physics /1998-12-14 Hardcover / 960 Pages
isbn-10: 1563967537 / isbn-13: 9781563967535
Hgcdte Detector Reliability Study for the Goes Program (Classic Reprint)
Forgotten Books /2024-01-31 Paperback / 115 Pages
isbn-10: 1528509110 / isbn-13: 9781528509114
Narrow-Gap Semiconductors and Related Materials, Proceedings of the INT Conference on Narrow-Gap Semiconductors and Related Materials, NIST, Gaithersburg, June 12-15, 1989
Seiler, David G. Littler, Christopher L.
CRC Press /1990-05-01 Hardcover / 364 Pages
isbn-10: 085274210X / isbn-13: 9780852742105
Frontiers of Characterization and Metrology for Nanoelectronics: 2009 (AIP Conference Proceedings, 1173)
David G. Seiler Rajinder P. Khosla Dan Herr Robert McDonald Alain C. Diebold C. Michael Garner
American Institute of Physics /2009-10-26 Hardcover / 320 Pages
isbn-10: 0735407126 / isbn-13: 9780735407121
