Yost, Paul R. books & textbook
Experience-Driven Leader Development: Models, Tools, Best Practices, and Advice for On-the-Job Development
McCauley, Cynthia D. Derue, D. Scott Yost, Paul R. Taylor, Sylvester
Jossey-Bass /2013-11-25 Hardcover / 608 Pages
isbn-10: 1118458079 / isbn-13: 9781118458075
Real Time Leadership Development
Yost, Paul R. Plunkett, Mary Mannion
Wiley-Blackwell /2009-05-18 Paperback / 256 Pages
isbn-10: 1405186674 / isbn-13: 9781405186674
Territoires de l'inquiétude: 16 récits de terreur (5)
Bloch, Robert Andrevon, Jean-Pierre Barbéri, Jacques Beaumont, Charles Blatrier, Jean-Michel Bradbury, Ray Braunbeck, Gary A. Brèque, Jean-Daniel Bryant, Edward Campbell, Ramsey Canal, Richard Chambon, Jacques Curval, Philippe Daniels, Lee Dann, Jack Darnaudet, François Dartevelle, Alain Davidson, Avram De Lint, Charles Denis, Sylvie Di Rollo, Thierry Dorémieux, Alain Duguël, Anne Dunyach, Jean-Claude Durastanti, Pierre-Paul Ellison, Harlan Etchison, Dennis Finney, Jack Fowler, Karen Joy Gaillard, Noé Gallagher, Stephen Gallerne, Gilbert Godwin, Earl Goldstein, Lisa Grant, Charles L. Hubert, Jean-Pierre Iss, Raymond Jackson, Shirley Jeter, K.W. Jouanne, Emmanuel Kennedy, Leigh Kilpatrick, Nancy King, Stephen Hoffman, Nina Kiriki Koontz, Dean R. Lansdale, Joe R. Lee, Tanith Leiber, Fritz Leloup, Fabienne Ligny, Jean-Marc Little, Bentley Lowry, Robert Matheson, Richard Matheson, Richard Christian McCammon, Robert Charnas, Suzy McKee Milési, Raymond Nguyen, Jean-Jacques Pelot, Pierre Petoud, Wildy Ptacek, Kathryn Yarbro, Chelsea Quinn Rasnic Tem, Steve Raveau, Patrick Reeves-Steven, Garfield Royle, Nicholas Ruellan, André Ryan, Alan Sarrantonio, Al Schow, David J. Sheffield, Charles Silva, David B. Simmons, Dan Sladek, John Slesar, Henry Smulders, Anne Stableford, Brian Terry, Gay P. Tuttle, Lisa Valéry, Francis Wagner, Karl Edward Walther, Daniel Wintrebert, Joëlle Yost, Scott D. Dorémieux, Alain Dorémieux, Alain
DENOEL /1992-09-09 Pocket Book / 320 Pages
isbn-10: 2207600270 / isbn-13: 9782207600276
Territoires de l'inquiétude: 16 récits de terreur (4)
Bloch, Robert Kennedy, Leigh Kilpatrick, Nancy King, Stephen Hoffman, Nina Kiriki Koontz, Dean R. Leiber, Fritz Leloup, Fabienne Ligny, Jean-Marc Little, Bentley Lowry, Robert Matheson, Richard Matheson, Richard Christian McCammon, Robert Charnas, Suzy McKee Milési, Raymond Nguyen, Jean-Jacques Pelot, Pierre Petoud, Wildy Ptacek, Kathryn Yarbro, Chelsea Quinn Rasnic Tem, Steve Raveau, Patrick Reeves-Steven, Garfield Royle, Nicholas Ruellan, André Ryan, Alan Sarrantonio, Al Schow, David J. Sheffield, Charles Silva, David B. Simmons, Dan Sladek, John Slesar, Henry Smulders, Anne Stableford, Brian Terry, Gay P. Tuttle, Lisa Valéry, Francis Wagner, Karl Edward Walther, Daniel Wintrebert, Joëlle Yost, Scott D. Dorémieux, Alain Andrevon, Jean-Pierre Barbéri, Jacques Beaumont, Charles Blatrier, Jean-Michel Bradbury, Ray Braunbeck, Gary A. Brèque, Jean-Daniel Bryant, Edward Campbell, Ramsey Canal, Richard Chambon, Jacques Curval, Philippe Daniels, Lee Dann, Jack Darnaudet, François Dartevelle, Alain Davidson, Avram De Lint, Charles Denis, Sylvie Di Rollo, Thierry Dorémieux, Alain Duguël, Anne Dunyach, Jean-Claude Durastanti, Pierre-Paul Ellison, Harlan Etchison, Dennis Finney, Jack Fowler, Karen Joy Gaillard, Noé Gallagher, Stephen Gallerne, Gilbert Godwin, Earl Goldstein, Lisa Grant, Charles L. Hubert, Jean-Pierre Iss, Raymond Jackson, Shirley Jeter, K.W. Jouanne, Emmanuel Lansdale, Joe R. Lee, Tanith Dorémieux, Alain
DENOEL /1992-02-13 Pocket Book / 320 Pages
isbn-10: 2207600246 / isbn-13: 9782207600245
Materials Reliability Issues in Microelectronics: Volume 225 (MRS Proceedings)
Lloyd, James R. Yost, Frederick G. Ho, Paul S.
Cambridge University Press /1991-10-22 Hardcover / 382 Pages
isbn-10: 1558991190 / isbn-13: 9781558991194
The Internet and American Business (History of Computing)
Aspray, William Ceruzzi, Paul E. Aspray, William Ceruzzi, Paul E. Greenstein, Shane Haigh, Thomas Campbell-Kelly, Martin Garcia-Swartz, Daniel D. Hanson, Ward Kirsh, David Goldfarb, Brent Ogan, Christine Beam, Randal A Yost, Jeffrey R. Ensmenger, Nathan L. Cortada, James W. Akera, Atsushi Cronin, Blaise Coy, Wolfgang
MIT Press /2010-08-13 Paperback / 608 Pages
isbn-10: 0262514818 / isbn-13: 9780262514811
