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Ho, Paul S. books & textbook


Electromigration in Metals: Fundamentals to Nano-Interconnects

Ho, Paul S.  Hu, Chao-Kun  Gall, Martin  Sukharev, Valeriy  

Cambridge University Press /2022-09-08 Hardcover / 430 Pages
isbn-10: 1107032385 / isbn-13: 9781107032385
   

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Diffusion Phenomena in Thin Films and Microelectronic Materials

Devendra Gupta  Paul S. Ho  

Noyes Publications /1989-01-15 Hardcover
isbn-10: 0815511671 / isbn-13: 9780815511670
   

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PRESSURE DEPENDENCE OF THE ELASTIC CONSTANTS FOR ALUMINUM FROM 77 DEGREES TO 300 DEGREES K

Ho, Paul S & Ruoff, Arthur L  

J Applied Physics /1969T Pamphlet

   

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Low Dielectric Constant Materials for IC Applications (Springer Series in Advanced Microelectronics)

Ho, Paul S.  Leu, Jihperng  Lee, Wei William  

Springer /2012-10-04 Paperback / 329 Pages
isbn-10: 3642632211 / isbn-13: 9783642632211
   

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Stress Induced Phenomena in Metallization: Fourth International Workshop, Tokyo, Japan, June, 1997

Hidekazu Okabayashi  S. Shingubara  Paul S. Ho  

American Institute of Physics /1998-02-20 Hardcover / 480 Pages
isbn-10: 1563966824 / isbn-13: 9781563966828
   

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Stress-Induced Phenomena in Metallization: Third International Workshop (AIP Conference Proceedings, No. 373)

Paul S. Ho  John Bravman  Che-Yu Li  John Sanchez  

American Institute of Physics /1996-04-15 Hardcover
isbn-10: 1563964392 / isbn-13: 9781563964398
   

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Stress-induced Phenomena in Metallization: Proceedings of the Second International Workshop held in Austin, Texas, March 1993 (AIP Conference Proceedings, 305)

Paul S. Ho  Paul Totta  Che-Yu Li  

American Institute of Physics /1994-04-14 Hardcover / 302 Pages
isbn-10: 1563962519 / isbn-13: 9781563962516
   

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