Gan, Zhenghao books & textbook
Semiconductor Process Reliability in Practice
Gan, Zhenghao Wong, Waisum Liou, Juin J.
McGraw Hill /2012-10-31 Hardcover / 624 Pages
isbn-10: 007175427X / isbn-13: 9780071754279
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections (Springer Series in Reliability Engineering)
Tan, Cher Ming Li, Wei Gan, Zhenghao Hou, Yuejin
Springer /2013-04-21 Paperback / 160 Pages
isbn-10: 1447126416 / isbn-13: 9781447126416