David G. Seiler,Alain C. Diebold,D. G. Seiler books & textbook
Characterization and Metrology for ULSI Technology 2000: International Conference (AIP Conference Proceedings, 550)
Alain C. Diebold D. G. Seiler David G. Seiler
American Institute of Physics /2001-03-01 Hardcover / 723 Pages
isbn-10: 156396967X / isbn-13: 9781563969676
Characterization and Metrology for ULSI Technology 2005 (AIP Conference Proceedings, 788)
David G. Seiler,Alain C. Diebold,D. G. Seiler
American Inst. of Physics /2005-09-01 Hardcover
isbn-10: 0735402779 / isbn-13: 9780735402775
