ISBN 9780819439017 books & textbook
Microelectronic Yield, Reliability, and Advanced Packaging (Proceedings of Spie)
Tan, Cher Ming Peng, Yeng-kaung Mahalingam, Mali Prasad, Krishnamachar
Society of Photo Optical / Paperback / 240 Pages
isbn-10: 0819439010 / isbn-13: 9780819439017
