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ISBN 1558993312 books & textbook

Materials Reliability in Microelectronics VI: Volume 428 (MRS Proceedings)

Clement, J. Joseph  Filter, William F.  Lenahan, Patrick M.  Oates, Anthony S.  Rosenberg, Robert  

Materials Research Society /1996-11-18 Hardcover / 583 Pages
isbn-10: 1558993312 / isbn-13: 9781558993310
 

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