Lenahan, Patrick M. books & textbook
Materials Reliability in Microelectronics VI: Volume 428 (MRS Proceedings)
Clement, J. Joseph Filter, William F. Lenahan, Patrick M. Oates, Anthony S. Rosenberg, Robert
Materials Research Society /1996-11-18 Hardcover / 583 Pages
isbn-10: 1558993312 / isbn-13: 9781558993310
