ISBN 1558992057 books & textbook
Materials Reliability in Microelectronics III: Volume 309 (MRS Proceedings)
Rodbell, Kenneth P. Filter, William F. Frost, Harold J. Ho, Paul S.
Cambridge University Press /1993-08-31 Hardcover / 516 Pages
isbn-10: 1558992057 / isbn-13: 9781558992054
