Postek, Michael T. books & textbook
Scanning Electron Microscopy: a Student's Handbook
Michael T. Postek Karen S. Howard Arthur H. Johnson Kathlyn L. McMichael
Ladd Research Industries /1980T Paperback / 305 Pages
New Research in Nanotechnology (Nanotechnology Science and Technology)
Postek, Michael T. Kopanski, Joseph Wollman, David
Nova Science Pub Inc /2011-06-30 Hardcover / 282 Pages
isbn-10: 1607411350 / isbn-13: 9781607411352
Integrated Circuit Metrology, Inspection, And Process Control VII
Society of Photo Optical /1993T Paperback
isbn-10: 0819411604 / isbn-13: 9780819411600
Scanning Microscopies 2012
SPIE Press / Paperback
isbn-10: 0819490563 / isbn-13: 9780819490568
Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors V: 24-25 August 2011, San Diego, California, United States
SPIE Press /2011-01-01 Paperback / 1 Pages
isbn-10: 0819487155 / isbn-13: 9780819487155
Scanning Microscopies 2011
SPIE Press /2011-01-01 Paperback
isbn-10: 0819486108 / isbn-13: 9780819486103
Scanning Microscopy 2010
SPIE Press / Paperback / 1 Pages
isbn-10: 081948217X / isbn-13: 9780819482174
Scanning Microscopy 2009 (Proceedings of Spie)
Postek, Michael T. Newbury, Dale E. Platek, S. Frank Joy, David C.
Society of Photo Optical /2009-01-01 Paperback
isbn-10: 0819476544 / isbn-13: 9780819476548
Instrumentation, Metrology, and Standards for Nanomanufacturing II (Proceedings of Spie)
Postek, Michael T. Allgair, John A.
Society of Photo Optical /2008-01-01 Paperback / 200 Pages
isbn-10: 081947262X / isbn-13: 9780819472625
Instrumentation, Metrology, and Standards for Nanomanufacturing (Proceedings of Spie)
Postek, Michael T. Allgair, John A.
Society of Photo Optical /2007-12-01 Paperback / 190 Pages
isbn-10: 0819467960 / isbn-13: 9780819467966
