Livshits, Pavel books & textbook
New Approaches to Image Processing based Failure Analysis of Nano-Scale ULSI Devices (Micro and Nano Technologies)
Zalevsky, Zeev Livshits, Pavel Gur, Eran
William Andrew /2013-12-02 Paperback / 110 Pages
isbn-10: 0323241433 / isbn-13: 9780323241434
