Baglin, John E. E. books & textbook
DETERMINATION OF SURFACE IMPURITY CONCENTRATION PROFILES BY NUCLEAR BACKSCATTERING
Ziegler, James F & Baglin, John E.E.
J Applied Physics /1971T Pamphlet
Proceedings of the Symposium on Thin Film Interfaces and Interactions
John M. Poate (eds.) John E. E. Baglin
Dielectrics and Insulation and Electronics Divisions, Electrochemical So /1980-01-01 Hardcover
Proceedings of the Symposium on Thin Film Phenomena Interfaces and Interactions. Proceedings Vol. 78-2
John E.E. & John M. Poate editors Baglin
Electrochemical Society /1978-01-01 Paperback
Ion Beams and Nano-Engineering: Volume 1181 (MRS Proceedings)
Ila, Daryush Chu, Paul K. Lindner, Jörg K. N. Kishimoto, Naoki Baglin, John E. E.
Cambridge University Press /2010-03-16 Hardcover / 173 Pages
isbn-10: 1605111546 / isbn-13: 9781605111544
