ISBN 9781605111285 books & textbook
CMOS Gate-Stack Scaling ― Materials, Interfaces and Reliability Implications: Volume 1155 (MRS Proceedings)
Demkov, Alexander A. Taylor, Bill Harris, H. Rusty Butterbaugh, Jeffery W. Rachmady, Willy
Cambridge University Press /2009-11-19 Hardcover / 194 Pages
isbn-10: 1605111287 / isbn-13: 9781605111285
