ISBN 9781605110806 books & textbook
Performance and Reliability of Semiconductor Devices: Volume 1108 (MRS Proceedings)
Mastro, Michael LaRoche, Jeffrey Ren, Fan Chyi, Jen-Inn Kim, Jihyun
Cambridge University Press /2009-04-08 Hardcover / 259 Pages
isbn-10: 1605110809 / isbn-13: 9781605110806
