ISBN 9781558994225 books & textbook
Materials Reliability in Microelectronics VIII: Volume 516 (MRS Proceedings)
Bravman, John C. Marieb, Thomas N. Lloyd, James R. Korhonen, Matt A.
Materials Research Society /1998-11-11 Hardcover / 365 Pages
isbn-10: 155899422X / isbn-13: 9781558994225
