ISBN 9781493966745 books & textbook
Scanning Electron Microscopy and X-Ray Microanalysis
Goldstein, Joseph I. Newbury, Dale E. Michael, Joseph R. Ritchie, Nicholas W.M. Scott, John Henry J. Joy, David C.
Springer /2017-11-18 Hardcover / 573 Pages
isbn-10: 149396674X / isbn-13: 9781493966745
