ISBN 9781475790290 books & textbook
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Echlin, Patrick Fiori, C.E. Goldstein, Joseph Joy, David C. Newbury, Dale E.
Springer /2013-06-08 Paperback / 466 Pages
isbn-10: 1475790295 / isbn-13: 9781475790290
