ISBN 9780819457479 books & textbook
Testing, Reliability, And Application Of Micro-And Nano-Material Systems III (Proceedings of Spie)
Geer, Robert E. Meyendor, Norbert Baaklini, George Y. Michel, Bernd
Society of Photo Optical /2005-01-01 Paperback / 168 Pages
isbn-10: 0819457477 / isbn-13: 9780819457479
