ISBN 9780306450457 books & textbook
Advances in X-Ray Analysis, Vol. 38
Bowen, D.K. Gilfrich, John V. Goldsmith, C.C. Huang, Ting C. Jenkins, Ron Noyan, I. Cev Predecki, Paul K. Smith, Deane K.
Springer /1995-09-30 Hardcover / 813 Pages
isbn-10: 0306450453 / isbn-13: 9780306450457
