ISBN 904817855X books & textbook

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test (Frontiers in Electronic Testing, 40)

Pavlov, Andrei Sachdev, Manoj

Springer /2010-10-28 Paperback / 210 Pages
isbn-10: 904817855X / isbn-13: 9789048178551