ISBN 3659255203 books & textbook
Strategies to Reduce Power during VLSI Circuit Testing: Reduction of Dynamic and Leakage Power during Testing of Digital VLSI Circuits
Kundu, Subhadip Chattopadhyay, Santanu
LAP LAMBERT Academic Publishing /2012-09-25 Paperback / 116 Pages
isbn-10: 3659255203 / isbn-13: 9783659255205
