ISBN 3642721087 books & textbook
X-Ray Microscopy and Spectromicroscopy: Status Report from the Fifth International Conference, Würzburg, August 19–23, 1996
Thieme, Jürgen Schmahl, Günter Rudolph, Dietbert Umbach, Eberhard
Springer /2014-08-23 Paperback / 402 Pages
isbn-10: 3642721087 / isbn-13: 9783642721083
