ISBN 0306458039 books & textbook
Advances in X-Ray Analysis, Vol. 39
Gilfrich, John V. Noyan, I. Cev Jenkins, Ron Huang, Ting C. Snyder, Robert L. Smith, Deane K. Zaitz, Mary Ann Predecki, Paul K.
Springer /1998-01-31 Hardcover / 925 Pages
isbn-10: 0306458039 / isbn-13: 9780306458033
