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Wu, Kai books & textbook

Handbook of Nanosafety: Measurement, Exposure and Toxicology

Vogel, Ulla  Savolainen, Kai  Wu, Qinglan  van Tongeren, Martie  Brouwer, Derk  Berges, Markus  

Academic Press /2014-01-21 Hardcover / 376 Pages
isbn-10: 0124166040 / isbn-13: 9780124166042
   

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Mooring System Engineering for Offshore Structures

Ma, Kai-Tung  Luo, Yong  Thomas Kwan, Chi-Tat  Wu, Yongyan  

Gulf Professional Publishing /2019-06-18 Paperback / 350 Pages
isbn-10: 0128185511 / isbn-13: 9780128185513
   

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Origin of Power Converters: Decoding, Synthesizing, and Modeling

Wu, Tsai-Fu  Chen, Yu-Kai  

Wiley /2020-04-14 Hardcover / 416 Pages
isbn-10: 1119632986 / isbn-13: 9781119632986
   

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科技中的化学/万物有化学

胡杨; 刘圆圆; 吴丹; 王凯  Hu Yang; Liu Yuan Yuan; Wu Dan; Wang Kai  

Jieli Publishing House /2021-09-01 Paperback
isbn-10: 7544872742 / isbn-13: 9787544872744
   

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生命中的化学/万物有化学

胡杨; 刘圆圆; 吴丹; 王凯  Hu Yang; Liu Yuan Yuan; Wu Dan; Wang Kai  

Jieli Publishing House /2021-09-01 Paperback
isbn-10: 7544872726 / isbn-13: 9787544872720
   

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Postsocialist Shrinking Cities (Routledge Contemporary Perspectives on Urban Growth, Innovation and Change)

Wu, Chung-Tong  Gunko, Maria  Stryjakiewicz, Tadeusz  Zhou, Kai  

Routledge /2023-09-25 Paperback / 392 Pages
isbn-10: 1032212810 / isbn-13: 9781032212814
   

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Graph Neural Networks for Natural Language Processing: A Survey (Foundations and Trends(r) in Machine Learning)

Wu, Lingfei  Chen, Yu  Shen, Kai  Guo, Xiaojie  Gao, Hanning  Li, Shucheng  Pei, Jian  Long, Bo  

Now Publishers /2023-01-25 Paperback / 224 Pages
isbn-10: 1638281424 / isbn-13: 9781638281429
   

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Hu sheng huaji vol.3 - Feng Zikai manhua ji 29

WU HAO RAN BIAN FENG ZI KAI HUI  

Dolphin Press /2014-08-01 Paperback

   

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IEEE Computer Magazine, Vol. 18, No. 6 (June, 1985) (ISSN: 0018-9162)

Daniel Gajski  Alexander Torres  Chee Fen Yu  Chuan-lin Wu  Guo-Jie Li  Benjamin W. Wah  Noriyoshi Ito  Rikio Onai  Takeo Kakuta  Kunio Murakami  Kai Hwang  Kenneth Wallgren  David W. Mizell  John R. Lehmann  Stephen L. Squires  Donald M. Austin  Michael C. Mulder  Jih-Kwon Peir  Peter C. Patton  Paul B. Schneck  

IEEE Computer Society /1985T Single Issue Magazine / 136 Pages

   

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