Hisham Bin Hamid, Nor books & textbook
An Improved Markov Random Field Design Approach For Digital Circuits: Introducing Fault-Tolerance With Higher Noise-Immunity For The Nano-Circuits As Compared To CMOS And MRF Designs
Anwer, Jahanzeb Hisham Bin Hamid, Nor Sagayan Asirvadam, Vijanth
LAP LAMBERT Academic Publishing /2011-05-10 Paperback / 88 Pages
isbn-10: 3844332634 / isbn-13: 9783844332636
