Duparre, Angela books & textbook
Optical Fabrication, Testing, and Metrology IV: 7-8 September 2011, Marseille, France
SPIE Press / Paperback
isbn-10: 0819487953 / isbn-13: 9780819487957
Optical Fabrication, Testing, and Metrology III (Proceedings of Spie)
Society of Photo Optical / Paperback / 454 Pages
isbn-10: 0819473324 / isbn-13: 9780819473325
Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies III (Proceedings of Spie)
Duparre, Angela Singh, Bhanwar Gu, Zu-Han
Society of Photo Optical /2007-01-01 Paperback / 250 Pages
isbn-10: 0819468207 / isbn-13: 9780819468208
Optical Fabrication, Testing, and Metrology II (Proceedings of Spie)
Duparre, Angela Geyl, Roland Wang, Lingli
Society of Photo Optical /2005-01-01 Paperback / 698 Pages
isbn-10: 0819459836 / isbn-13: 9780819459831
Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II (Proceedings of Spie)
Duparre, Angela Singh, Bhanwar Gu, Zu-Han
Society of Photo Optical /2005-01-01 Paperback / 416 Pages
isbn-10: 081945883X / isbn-13: 9780819458834
Advanced Characterization Techiniques for Optics, Semiconductors, and Nanotechnologies: 3-5 August 2003 San Diego, California, USA (Proceedings of Spie Volume 5188)
Duparre, Angela Singh, Bhanwar
Society of Photo Optical /2003-12-29 Paperback
isbn-10: 0819450618 / isbn-13: 9780819450616
Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries II (Proceedings of Spie)
Duparre, Angela Singh, Bhanwar
Society of Photo Optical /2001-01-01 Paperback / 304 Pages
isbn-10: 0819441635 / isbn-13: 9780819441638
