ISBN 9783662144909 books & textbook
X-Ray Microscopy II: Proceedings of the International Symposium, Brookhaven, NY, August 31–September 4, 1987 (Springer Series in Optical Sciences)
Sayre, David Howells, Malcolm Kirz, Janos Rarback, Harvey
Springer /2013-10-03 Paperback / 469 Pages
isbn-10: 3662144905 / isbn-13: 9783662144909