ISBN 9781558993778 books & textbook
Materials Reliability in Microelectronics VII: Volume 473 (MRS Proceedings)
Clement, J. Joseph Keller, Robert R. Krisch, Kathleen S. Sanchez Jr, John E. Suo, Zhigang
Materials Research Society /1997-10-20 Hardcover / 457 Pages
isbn-10: 1558993770 / isbn-13: 9781558993778
