ISBN 9780792366867 books & textbook
Defects in SiO2 and Related Dielectrics: Science and Technology (NATO Science Series II: Mathematics, Physics and Chemistry, 2)
Pacchioni, Gianfranco Skuja, Linards Griscom, David L.
Springer /2000-12-31 Paperback / 632 Pages
isbn-10: 0792366867 / isbn-13: 9780792366867
