ISBN 0306472929 books & textbook
Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
Goldstein, Joseph Newbury, Dale E. Joy, David C. Lyman, Charles E. Echlin, Patrick Lifshin, Eric Sawyer, Linda Michael, J.R.
Springer /2003-01-31 Hardcover / 708 Pages
isbn-10: 0306472929 / isbn-13: 9780306472923
