ISBN 0306422875 books & textbook
Advances in X-Ray Analysis, Vol. 29
Barrett, Charles S. Cohen, jerome B. Faber Jr., John Jenkins, Ron Leyden, Donald E. Russ, John C. Predecki, Paul K.
Springer /1986-06-30 Hardcover / 618 Pages
isbn-10: 0306422875 / isbn-13: 9780306422874
